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WCT-120
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Suns-Voc
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BLS/BCT
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SBS-150
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WCT-IL800
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FMT-350
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Cell Testers
  Sinton Instruments — Our Products

thumbnail photo of WCT-120 lnk to WCT-120 product page   WCT-120: The Standard R&D Wafer-Lifetime Tool
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Best available lifetime measurement accuracy. Measure lifetime and surface recombination for a wafer of any quality or crystallinity.
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thumbnail photo of Suns-Voc instrument link to Suns-Voc product page   Suns-Voc: Post-Diffusion Process Control
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Perfect for paste-firing optimization and process control. Open-circuit method indicates the upper bound of efficiency for any solar cell precursors.
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thumbnail photo of BLS/BCT instrument   BLS/BCT: Bulk Silicon Characterization
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Measure lifetime of bulk material prior to sawing with no surface preparation. Accurate measurement of bulk properties in both low- and high-lifetime material.
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Sinton Instruments SBS-150 photo Sinton Instruments SBS-150 photo   SBS-150 Bulk Silicon Lifetime Mapping
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Simple and flexible silicon lifetime mapping for production environments, featuring a lifetime measurement range of several orders of magnitude.
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thumbnail photo of WCT-IL800 link to WCT-IL800 product page   WCT-IL800: Inline Wafer Testing
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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Sinton Flash Module Tester photo link to FMT/CCT product page   FMT-350: Flash Module Tester
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Measures any crystalline silicon module, including high- capacitance, high-effciency modules, using patented electronic-load technology. Results include Suns-Voc and I-V curves. Over 1 GW of product tested to date. Also ideal for R&D.
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thumbnail photo of FMT tester link to FMT/CCT product page   xCT: Cell Tester Series
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Measures standard or high-capacitance high-effciency cells. Three models are available (see below). Interchangeable chucks permit measurements of conventional or backside-contact solar cells.
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      Production Lifetime-Test Instruments
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      WCT-120   IL-800   BCT   BLS   SBS-150
  Wafer optimized                
  Bulk silicon optimized              
  Automated mapping                  
  In-line production tool                  
  Relative cost ($$$$)   $   $$$   $   $$   $$$$
  Configuration   table-top   mounted
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  hand-held   hand-held   bench-top
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      Cell and Module Flash Test Instruments for IV Curves
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      FMT   FCT   CCT   HCCT    
  Conventional cells              
  Backside contact cells      
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  Modules                  
  0.2-1.2X                
  1-20X                  
  20-1000x                  
  Sample size   1.5 x 1 m   up to 156 mm   125 mm   10 mm    
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      Suns-Voc Wafer Testing to Optimize Metallization Process
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  Wafers with junctions                  
  Monitor metallization                  
  Monitor firing sequence                  
  Small grained polysilicon                  
  Non-silicon materials                  
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