Sinton Instruments - Our Products

		WCT-120: The Standard R&D Wafer-Lifetime Tool Best available lifetime measurement accuracy. Measure lifetime and surface recombination for a wafer of any quality or crystallinity. more information

		Suns-Voc: Post-Diffusion Process Control Perfect for paste-firing optimization and process control. Open-circuit method indicates the upper bound of efficiency for any solar cell precursors. more information

		BLS/BCT: Bulk Silicon Characterization Measure lifetime of bulk material prior to sawing with no surface preparation. Accurate measurement of bulk properties in both low- and high-lifetime material. more information

		WCT-IL800: Inline Wafer Testing Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps. more information

		FMT/CCT: Flash Module Tester and Cell Testers Measure high-efficiency cells and modules that are too capacitive for conventional flash testers. Incorporates advanced interpretation of results for better use in diagnostics including the Suns-Voc curve. Available for 1X to 2000X concentration. more information

Product Comparison Chart

	Production Lifetime-Test Instruments

	WCT-120	IL-800	BCT	BLS	BLA
Wafer optimized	•	•
Bulk silicon optimized			•	•	•
Automated mapping					•
In-line production tool		•
Relative cost ($$$$)	$	$$$	$	$$	$$$$
Configuration	table top	mounted in-line	hand-held	hand-held	bench-top


	Cell and Module Flash Test Instruments for IV Curves

	FCT	CCT	HCCT	FMT
Conventional cells	•	•	•
Backside contact cells	• (different configuration)	• (different configuration)	•
Modules				•
0.2-1.2X	•			•
1-30X		•
20-1000x			•


	Suns-Voc Wafer Testing to Optimize metallization Process

Wafers with junctions	•
Monitor metallization	•
Monitor firing sequence	•
Small grained polysilicon	•
Non-silicon materials	•



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