Product information • WCT-120 • Suns-Voc • BLS/BCT • SBS-150 • WCT-IL800 • FMT-350 • Cell Testers		WCT-120: The Standard R&D Wafer-Lifetime Tool Best available lifetime measurement accuracy. Measure lifetime and surface recombination for a wafer of any quality or crystallinity. more information   Suns-Voc: Post-Diffusion Process Control Perfect for paste-firing optimization and process control. Open-circuit method indicates the upper bound of efficiency for any solar cell precursors. more information   BLS/BCT: Bulk Silicon Characterization Measure lifetime of bulk material prior to sawing with no surface preparation. Accurate measurement of bulk properties in both low- and high-lifetime material. more information   SBS-150 Bulk Silicon Lifetime Mapping Simple and flexible silicon lifetime mapping for production environments, featuring a lifetime measurement range of several orders of magnitude. more information   WCT-IL800: Inline Wafer Testing Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps. more information   FMT-350: Flash Module Tester Measures any crystalline silicon module, including high- capacitance, high-effciency modules, using patented electronic-load technology. Results include Suns-Voc and I-V curves. Over 1 GW of product tested to date. Also ideal for R&D. more information   xCT: Cell Tester Series Measures standard or high-capacitance high-effciency cells. Three models are available (see below). Interchangeable chucks permit measurements of conventional or backside-contact solar cells. more information back to top		• Product comparison chart • Request a quote • Technical questions • Product support
			Product Comparison Chart       Production Lifetime-Test Instruments       WCT-120   IL-800   BCT   BLS   SBS-150   Wafer optimized   •   •               Bulk silicon optimized           •   •   •   Automated mapping                   •   In-line production tool       •               Relative cost ($$$$)   $   $$$   $   $$   $$$$   Configuration   table-top   mounted in line   hand-held   hand-held   bench-top       Cell and Module Flash Test Instruments for IV Curves       FMT   FCT   CCT   HCCT       Conventional cells       •   •   •       Backside contact cells       • (different configuration)   • (different configuration)   •       Modules   •                   0.2-1.2X   •   •               1-20X           •           20-1000x               •       Sample size   1.5 x 1 m   up to 156 mm   125 mm   10 mm           Suns-Voc Wafer Testing to Optimize Metallization Process   Wafers with junctions   •                   Monitor metallization   •                   Monitor firing sequence   •                   Small grained polysilicon   •                   Non-silicon materials   •                 back to top Request a quote
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