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WCT-120
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Suns-Voc
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WCT-IL800
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BLS/BCT
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FMT/CCT
  Sinton Instruments — Our Products

thumbnail photo of WCT-120 lnk to WCT-120 product page   WCT-120: The Standard R&D Wafer-Lifetime Tool
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Best available lifetime measurement accuracy. Measure lifetime and surface recombination for a wafer of any quality or crystallinity.
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thumbnail photo of Suns-Voc instrument link to Suns-Voc product page   Suns-Voc: Post-Diffusion Process Control
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Perfect for paste-firing optimization and process control. Open-circuit method indicates the upper bound of efficiency for any solar cell precursors.
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thumbnail photo of BLS/BCT instrument   BLS/BCT: Bulk Silicon Characterization
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Measure lifetime of bulk material prior to sawing with no surface preparation. Accurate measurement of bulk properties in both low- and high-lifetime material.
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thumbnail photo of WCT-IL800 link to WCT-IL800 product page   WCT-IL800: Inline Wafer Testing
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Pre-process elimination of low-quality wafers using measured lifetime, trapping, and resistivity. Process control and optimization at dopant diffusion and nitride deposition steps.
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thumbnail photo of FMT tester link to FMT/CCT product page   FMT/CCT: Flash Module Tester and Cell Testers
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Measure high-efficiency cells and modules that are too capacitive for conventional flash testers. Incorporates advanced interpretation of results for better use in diagnostics including the Suns-Voc curve. Available for 1X to 2000X concentration.
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      Production Lifetime-Test Instruments
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      WCT-120   IL-800   BCT   BLS   BLA
  Wafer optimized                
  Bulk silicon optimized              
  Automated mapping                  
  In-line production tool                  
  Relative cost ($$$$)   $   $$$   $   $$   $$$$
  Configuration   table top   mounted
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  hand-held   hand-held   bench-top
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      Cell and Module Flash Test Instruments for IV Curves
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      FCT   CCT   HCCT   FMT    
  Conventional cells              
  Backside contact cells  
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  Modules                  
  0.2-1.2X                
  1-30X                  
  20-1000x                  
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      Suns-Voc Wafer Testing to Optimize metallization Process
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  Wafers with junctions                  
  Monitor metallization                  
  Monitor firing sequence                  
  Small grained polysilicon                  
  Non-silicon materials                  
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