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  Commonly Cited Lifetime Tester Papers

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yellow square		 D.E. Kane, and R.M. Swanson, "Measurement of the Emitter Saturation Current by a Contactless Photoconductivity Decay Method," Proc of the 18th IEEE Photovoltaic Specialists Conference, pp. 578-583, 1985.

Classic reference for a method to separate bulk recombination from dopant diffusion recombination on lightly-doped wafers using the injection-level dependence of lifetime.
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yellow square		 R.A. Sinton, and R.M. Swanson, "Recombination in highly injected silicon (solar cells)," IEEE Trans. Electron Devices (USA), vol. 34, no. 6, pp. 1380-9, Jun 1987. download PDF of paper (296 KB)
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Determination of the ambipolar recombination coefficient at 1.66e-30 cm6/s +or-15%.
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yellow square		 R.A. Sinton, A. Cuevas, and M. Stuckings, "Quasi-Steady-State Photoconductance, A New Method for Solar Cell Material and Device Characterization," Proc of the 25th IEEE Photovoltaic Specialists Conference, pp. 457-460, 1996. download PDF of paper (404 KB)
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First major reference for QSSPC photoconductance method.
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yellow square		 A.S. Cuevas, and R.A. Sinton, "Prediction of the open-circuit voltage of solar cells from the steady-state photoconductance," Progress in Photovoltaics: Research and Applications, vol. 5, no. 2, pp. 79-90, Mar.-Apr. 1997.
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Tutorial-style paper concerning applications of QSSPC measurements to solar cells.
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yellow square		 D.K. Schroder, "Carrier Lifetimes in Silicon," IEEE Transactions on Electron Devices, vol. 44, no. 1, pp. 160-170, 1997.
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yellow square		 C. Berge, J. Schmidt, B. Lenkeit, H. Nagel, and A.G. Aberle, "Comparison of Effective Carrier Lifetimes in Silicon Determined by Transient and Quasi-Steady-State Photoconductance Measurements," 2nd World Conference on Photovoltaic Solar Energy Conversion, pp. 1426-1429, 1998.
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yellow square		 H. Nagel, C. Berge, and A.G. Aberle, "Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors," Journal of Applied Physics, vol. 86, no. 11, pp. 6218-6221, Dec 1999.
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The math for analyzing data using the fully time dependent solutions rather than the steady-state or transient limits.
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yellow square		 J. Schmidt, "Measurement of differential and actual recombination parameters on crystalline silicon wafers," IEEE Transactions on Electron Devices, vol. 46, no. 10, pp. 2018-2025, Oct. 1999.
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yellow square		 M. Bail, and R. Brendel, "Separation of Bulk and Surface Recombination by Steady State Photoconductance Measurements," Proc of the 16th European Photovoltaic Solar Energy Conference, May 2000.
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A very nice application note for using 2 wavelengths of light for separating surface and bulk recombination.
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yellow square		 A. Cuevas, M. Kerr, D. Macdonald, and R.A. Sinton, "Emitter quantum efficiency from contactless photoconductance measurements," Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference, pp. 108-11, Sep 2000.
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yellow square		 D. MacDonald, and A. Cuevas, "Reduced fill factors in multicrystalline silicon solar cells due to injection-level dependent bulk recombination lifetimes," Progress in Photovoltaics, vol. 8, pp. 363-375, 2000.
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Describes how changes in the bulk lifetime will lower the fill factor of multicrystalline silicon solar cells.
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yellow square		 H. Nagel, B. Lenkeit, R.A. Sinton, A. Metz, and R. Hezel, "Relationship between effective carrier lifetimes in silicon determined under steady-state and transient illumination," Proc of the 16th European Photovoltaic Solar Energy Conference, 2000.
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yellow square		 A. Castaldini, D. Cavalcoli, A. Cavallini, M. Rossi, M. Spiegel, and T. Pernau, "Minority Carrier Lifetimes of Multicrystalline SI Obtained from Different Methods: A Comparison," 17th European Photovoltaic Solar Energy Conference, pp. 1921-1924, Oct 2001.
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yellow square		 R. Lago-Aurrekoetxea, I. Tobias, C. del Canizo, et al., "Lifetime measurements by photoconductance techniques in wafers immersed in a passivating liquid," Journal of the Electrochemical Society, vol. 148, no. 4, pp. G200-G206, Apr. 2001.
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yellow square		 D.H. Neuhaus, P.P. Altermatt, A.B. Sproul, R.A. Sinton, A. Schenk, A. Wang, and A.G. Aberle, "Method for measuring minority and majority carrier mobilities in solar cells wafers passivated with hydrogenated amorphous silicon films," 17th European Photovoltaic Solar Energy Conference, pp. 242-245, Oct 2001.
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yellow square		 R. Brendel, M. Bail, B. Bodmann, et al., "Analysis of photoexcited charge carrier density profiles in Si wafers by using an infrared camera," Applied Physics Letters, vol. 80, no. 3, pp. 437-439, Jan 2002.
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yellow square		 S. Rein, P. Lichtner, W. Warta, and S.W. Glunz, "Advanced Defect Characterization by Combining Temperature- and Injection-Dependent Lifetime Spectroscopy (TDLA and IDLS)," Conference Record of the Twenty Ninth IEEE Photovoltaic Specialists Conference, pp. 190-193, 2002.
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yellow square		 S. Rein, T. Rehrl, W. Warta, and S. W. Glunz, "Lifetime spectroscopy for defect characterization: Systematic analysis of the possibilities and restrictions," Journal of Applied Physics, vol. 91, no. 3, pp. 2059, Feb 2002.
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yellow square		 A. Cuevas, and R. Sinton, "Characterization and Diagnosis of Silicon Wafers and Devices," Practical Handbook of Photovoltaics: Fundamentals and Applications, Tom Markvart and Luis Castaner, Editors, Elsevier, Ltd., 2003.
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Overview of QSSPC analysis and applications in a handbook format.
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yellow square		 J. Schmidt, "Temperature- and injection-dependent lifetime spectroscopy for the characterization of defect centers in semiconductors," Applied Physics Letters, vol. 82, no. 13, pp. 2178-2180, Mar 2003.
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Generalization of QSSPC for temperature-dependent measurements.
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yellow square		 D. H. Macdonald, L. J. Geerligs, and A. Azzizi, "Iron detection in crystalline silicon by carrier lifetime measurements for arbitrary injection and doping," Journal of Applied Physics, vol. 95, no. 3, pp. 1021, Feb 2004.
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A model application for QSSPC to study SRH bulk recombination with practical implications. Uses the lifetime tester to measure the iron concentration in silicon.
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R. A. Sinton, T. Mankad, S. Bowden, and N. Enjalbert, "Evaluating Silicon Blocks and Ingots With Quasi-Steady-State Lifetime Measurements," 19th European Photovoltaic Energy Conference, 2004. download PDF of paper (320 KB)
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Demonstrates how to measure iron concentration in silicon blocks and determine how the wafers will perform during processing.
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