Sinton Instruments Publications

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Partial Literature List

Application Notes Available

Sinton Instruments has a number of application notes available as reference for existing customers to assist you in optimizing your process and use of our instruments:

  • Measuring Fe:B pairs in silicon
  • Testing wafers after phosphorus diffusion or nitride
  • Testing bare wafers
  • Testing silicon ingot and blocks with the Sinton BLS/BCT instruments
  • Lifetime measurements on B-doped CZ bulk silicon with the BLS/BCT instruments
  • Surface recombination current and bulk lifetime measurements with WCT-120 instruments

If you are an existing customer, using one of our instruments, and would like to obtain one of these application notes, please fill out the form below, and we will be happy to send it to you.

You can also call us at +1.303.945.2113 (please see the contact page for our hours of operation).

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Add a Reference

If you would like us to include your research or R&D work in our list of publications, please use the link below to send us information about your paper. We are especially interested in featuring recent conference or journal papers that use Sinton Testers.

Please include the complete reference details as well as any comments you might have. Thank you.

Submit a Reference
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